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Reliability experiments on hybrid circuits are usually carried out by accelerated ageing test. The circuits or the components under test are stored at an elevated ambient temperature and the change of...
The paper reports the effect of addition of metal oxides in lead borosilicate glasses on electrical characteristics of SbSn alloy-based thick-film resistors. The Sb and Sn powder (1: 1 by weight) is t...
Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.In this paper investigations based on temperature dependent 1/f noise measurements are reported.
The evolution of microstructure and electrical properties of silver-based thick-film metallizations of silicon solar cells prepared by infrared firing processes has been investigated. The performance ...
Substituting glass by SiO2 in thick film resistors results in a small increase of R□, a decrease of dR□/dT and an increase of d2R□/dT2 (at room temperature). From these experimental results it follows...
This communication reports the preliminary experimental results on a triple-segment thick-film resistor structure. This structure, first reported by Karlskov Jensen comprises two or more partly over...
The temperature characteristics of RuO2-based thick film resistors on various substratcs having different thermal expansion coefficient have been investigated.It became clear that, if the thermal expa...
Standard thick film resistor pastes exhibit changes in their electrical characteristics when printed on top of dielectric layers. Of particular interest is the inherent change in their temperature coe...
Work has been carried out to develop a new ruthenium oxide based thick film resistor whose resistance is independent of the contact area of the conductor to the resistor. Such a resistor can then be c...
The problems in forming a useful model of a thick film component have been analysed. The need for such a model has been shown. Common features of thick film structures have been defined and, using the...
A model for time-to-failure prediction based on component parameter drift is described. The idea for creation of this model is based on the influence of time-dependent random and non random factors on...
Schottky-barrier diodes have been fabricated using a thick-film technique. A change in V–I characteristic with firing temperature has been observed. This technique is compatible with hybrid circuit te...
The investigations of low resistance thick film fail-safe resistors are presented. Particularly the shape of a resistive path; the temperature of the central part of the resistor while increasing the ...
SEM–observation and analysis provide a quick and reliable method of predicting the cross-over and multilayer characteristics of a dielectric paste. Surface and bulk porosity, flow behaviour and chemic...
The influence of conductor particle size distribution on the blending curve of epoxy-based thick film resistors has been investigated. It was found that the critical volume fraction shifts to higher v...

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