搜索结果: 1-15 共查到“Microscopy”相关记录35条 . 查询时间(0.043 秒)
2018年7月6日至8日，Scanning Electron Microscopy Summer School（以下简称SEM School）在物质学院成功举办。此次大型培训活动由上海科技大学特聘教授Osamu Terasaki发起，由Sam Stevens (Lecturer at Exeter University)组织并主讲，旨在使学员们由零基础快速入门，不仅学习扫描电镜的原理及操作方法，而...
中国地质大学科学技术发展院宋潮龙等机电学院, Lab on a Chip, 27 March 2018. Opto-acousto-fluidic microscopy for three-dimensional label-free detection of droplets and cells in microchannels（图）
荧光剂；纳米颗粒；实现；物质；检测；分析
2021/10/21
2018年3月27日，微流控领域国际顶级期刊《Lab on a Chip》刊发了中国地质大学机电学院宋潮龙教授的最新研究成果：“Opto-acousto-fluidic microscopy for three-dimensional label-free detection of droplets and cells in microchannels”，该论文被推荐为封面文章。
2018年SPIE内窥镜显微镜会议（SPIE Endoscopic Microscopy XIII）。
2018年SPIE三维和多维显微镜：图像采集和处理会议（SPIE Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV）
2018年 SPIE三维 多维显微镜 图像采集 处理 会议
2017/11/28
2018年SPIE三维和多维显微镜：图像采集和处理会议（SPIE Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV）。
第20届非接触原子力显微镜国际会议（20th International Conference on Non-Contact Atomic Force Microscopy）
第20届 非接触原子力 显微镜 国际会议
2017/7/6
NC-AFM 2017 is the 20th international conference on Non-Contact Atomic Force Microscopy (NC-AFM), which is one of the most influential conference series in the field of scanning probe microscopy.
Since the invention in 1980s, scanning probe microscopy (SPM) has been considered as the valuable avenue to visualize topography of sample in nanoscale. After more than 30-year development, SPMs have ...
2017计算机视觉显微镜图像分析研讨会（The Workshop on Computer Vision for Microscopy Image Analysis）(CVMI)
2017年 计算机视觉显微镜图像分析 研讨会
2017/6/22
The Workshop on Computer Vision for Microscopy Image Analysis (CVMI) will be held on July 21st, 2017 in conjunction with the CVPR 2017 conference. It is focused primarily on analyzing microscopy image...
Electron microscopy has been a key enabling technique for advancing our understanding of the structure and behaviour of materials: atomic-scale imaging of atoms and defects has led to substantial brea...
2016年动态材料现象的原位电子显微镜技术研讨会（Symposium CM4—In Situ Electron Microscopy of Dynamic Materials Phenomena）
动态材料现象 原位电子显微镜技术 研讨会
2017/2/15
In recent years, in situ transmission electron microscopy (TEM) has been well recognized as a powerful tool for the study of materials dynamic processes. For instance, it has been possible to reveal s...
第二届表面与显微术国际论坛（The 2nd International Forum on Surface and Microscopy）
表面与显微术 国际论坛 光学显微成像 纳米显微镜技术 高光谱成像技术
2017/2/15
2015年7月23-25日在哈尔滨召开国内首个光学显微成像的专题会议，为持续促进本领域技术的完善与发展，学会定于2017年8月7-9日召开第二届会议。旨在汇聚从事光学显微技术的专业人员开展学术交流，为科研工作者提供一个展示前瞻性观点，探讨关键技术的平台。会议主题不仅包括光学显微技术研究与应用的广泛领域，如：纳米显微镜技术、高光谱成像技术、非线性激发显微成像、荧光相关光谱技术、光学相干层析成像、共聚...
2017年第17届生物医学科学多光子显微镜研讨会（Multiphoton Microscopy in the Biomedical Sciences XVII）
Keynote Session Technology Development
2017/1/20
Conference attendees are invited to attend the BiOS poster session on Sunday evening. Come view the posters, enjoy light refreshments, ask questions, and network with colleagues in your field. Authors...
BiOS is organized into six tracks. Choose a track and click to see the list of conferences.Review conference details by clicking on the titles below. These details include paper titles, authors, sched...
Compressive Fluorescence Microscopy for Biological and Hyperspectral Imaging
compressive sensing sparse images fluorescence microscopy biological imaging
2015/6/17
The mathematical theory of compressed sensing (CS) asserts that one can acquire signals from measurements whose rate is much lower than the total bandwidth. Whereas the CS theory is now well developed...
Functional studies of the kidney of living animals using multicolor 2-photon microscopy
fluorescence microscopy 2-photon
2014/12/11
Optical microscopy, when applied to living animals, provides a powerful means of studying cell biology in the most physiologically relevant setting. The ability of two-photon microscopy to collect opt...
Applications of atomic force microscopy for the assessment of nanoscale morphological and mechanical properties of bone
Atomic Force Microscopy Scanning probe microscopy
2014/11/6
Scanning probe microscopy (SPM) has been in use for 30 years, and the form of SPM known as atomic force microscopy (AFM) has been around for 25 of those years. AFM has been used to produce high resolu...